The Fine Pitch Double Plunger Probe FP110DF0329P007U006L047 (item number 1040994) is designed for precise contacting where installation space is limited. Tip style 03 (Conical 60°) targets FP110DF0329P007U006L047 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP110DF0329P007U006L047, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.17 mm / 7 mil, spring force 6 cN, continuous current 0.4 A.
