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FP110DF0329P007U006L047 Perspective 1 FP110DF0329P007U006L047 Perspective 2

Fine Pitch Probes (< 300µm) FP110DF0329P007U006L047

Item number 1040994

Technical data sheet

Quantity

Technical data

General
Structure Double Plunger Probe
Type/family FP-DF
Pitch (mm/mil) 0,17 / 7
Temperature -45°C...+120°C
Dimensions
Total length (mm) 4.7
Protrusion height (mm) 0.6
Tip style diameter (mm) 0.07
Barrel diameter (mm) 0.11
Tip style diameter (mm) 2 0.07
Materials and surfaces
Tip style 03
Tip style 2 29
Plunger material Palladium
Plunger plating Uncoated
Barrel material Nickel
Barrel plating Gold
Spring material Spring steel
Spring plating Gold
Plunger material 2 Palladium
Plunger plating 2 Uncoated
Mechanical specifications
Preload (cN) 1.7
Spring force (cN) 6
Nominal travel (mm) 0.4
Maximum travel (mm) 0.5
Electrical specifications
Continuous current (A) 0.4
Typical contact resistance (mOhm) 500

Graphics

FP110DF0329P007U006L047 Family designation FP110DF0329P007U006L047 Tip style 1 FP110DF0329P007U006L047 Tip style 2

Beschreibung des Produkts

The Fine Pitch Double Plunger Probe FP110DF0329P007U006L047 (item number 1040994) is designed for precise contacting where installation space is limited. Tip style 03 (Conical 60°) targets FP110DF0329P007U006L047 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP110DF0329P007U006L047, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.17 mm / 7 mil, spring force 6 cN, continuous current 0.4 A.