Datos técnicos
| General | |
|---|---|
| Estructura | Double Plunger Probe |
| Tipo/Familia | FP-D |
| Paso (mm/mil) | 0,40 / 16 |
| Dimensiones | |
|---|---|
| Longitud total (mm) | 6.6 |
| Altura sobresaliente (mm) | 1.3 |
| Diámetro del estilo de punta (mm) | 0.15 |
| Diámetro del casquillo (mm) | 0.3 |
| Diámetro del estilo de punta (mm) 2 | 0.15 |
| Materiales y superficies | |
|---|---|
| Estilo de punta | 29 |
| Estilo de punta 2 | 29 |
| Material del émbolo | Beryllium copper |
| Recubrimiento del émbolo | Gold |
| Material del casquillo | Nickel |
| Recubrimiento del casquillo | Gold |
| Material del resorte | High-grade steel |
| Recubrimiento del resorte | Gold |
| Material del émbolo 2 | Beryllium copper |
| Recubrimiento del émbolo 2 | Gold |
| Especificaciones mecánicas | |
|---|---|
| Precarga (cN) | 6 |
| Fuerza del resorte (cN) | 35 |
| Recorrido nominal (mm) | 0.5 |
| Recorrido máximo (mm) | 0.6 |
| Especificaciones eléctricas | |
|---|---|
| Resistencia de contacto típica (mΩ) | 100 |
Gráficos
Beschreibung des Produkts
FP300D2929B015G035L066 (item number 1051670) belongs to the Fine Pitch Probe range for miniaturized test tasks with limited installation space. Tip style 29 (4-point crown) targets FP300D2929B015G035L066 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP300D2929B015G035L066, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. The design combines a pitch of 0.4 mm / 16 mil with tip style 29 (4-point crown) and a tip diameter of 0.15 mm. Spring force is 35 cN at a nominal travel of 0.5 mm. The plunger in FP300D2929B015G035L066 is made of beryllium copper and is gold-plated.