FP300D2929B015G035L066 (item number 1051670) belongs to the Fine Pitch Probe range for miniaturized test tasks with limited installation space. Tip style 29 (4-point crown) targets FP300D2929B015G035L066 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP300D2929B015G035L066, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. The design combines a pitch of 0.4 mm / 16 mil with tip style 29 (4-point crown) and a tip diameter of 0.15 mm. Spring force is 35 cN at a nominal travel of 0.5 mm. The plunger in FP300D2929B015G035L066 is made of beryllium copper and is gold-plated.
