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FP300D2929B015G035L066 Perspective 1 FP300D2929B015G035L066 Perspective 2

Fine Pitch Probes (300µm - 500µm) FP300D2929B015G035L066

Item number 1051670

Technical data sheet

Quantity

Technical data

General
Structure Double Plunger Probe
Type/family FP-D
Pitch (mm/mil) 0,40 / 16
Dimensions
Total length (mm) 6.6
Protrusion height (mm) 1.3
Tip style diameter (mm) 0.15
Barrel diameter (mm) 0.3
Tip style diameter (mm) 2 0.15
Materials and surfaces
Tip style 29
Tip style 2 29
Plunger material Beryllium copper
Plunger plating Gold
Barrel material Nickel
Barrel plating Gold
Spring material High-grade steel
Spring plating Gold
Plunger material 2 Beryllium copper
Plunger plating 2 Gold
Mechanical specifications
Preload (cN) 6
Spring force (cN) 35
Nominal travel (mm) 0.5
Maximum travel (mm) 0.6
Electrical specifications
Typical contact resistance (mOhm) 100

Graphics

FP300D2929B015G035L066 Family designation FP300D2929B015G035L066 Tip style 1 FP300D2929B015G035L066 Tip style 2

Beschreibung des Produkts

FP300D2929B015G035L066 (item number 1051670) belongs to the Fine Pitch Probe range for miniaturized test tasks with limited installation space. Tip style 29 (4-point crown) targets FP300D2929B015G035L066 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP300D2929B015G035L066, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. The design combines a pitch of 0.4 mm / 16 mil with tip style 29 (4-point crown) and a tip diameter of 0.15 mm. Spring force is 35 cN at a nominal travel of 0.5 mm. The plunger in FP300D2929B015G035L066 is made of beryllium copper and is gold-plated.