Datos técnicos
| General | |
|---|---|
| Estructura | Coaxial Probe |
| Tipo/Familia | HF77 |
| Paso (mm/mil) | 12,0 / 472 |
| Dimensiones | |
|---|---|
| Longitud total (mm) | 30.5 |
| Diámetro del estilo de punta (mm) | 3.4 |
| Materiales y superficies | |
|---|---|
| Estilo de punta | 16 |
| Material del estilo de punta | Beryllium copper |
| Recubrimiento del estilo de punta | Gold |
| Material del émbolo | Beryllium copper |
| Recubrimiento del émbolo | Gold |
| Especificaciones mecánicas | |
|---|---|
| Precarga (cN) | 280 |
| Fuerza del resorte (cN) | 420 |
| Recorrido nominal (mm) | 1.4 |
| Recorrido máximo (mm) | 2.2 |
| Conexión | Plug |
| Especificaciones eléctricas | |
|---|---|
| Impedancia (Ω) | 50 |
| Frecuencia (GHz) | 12 |
Gráficos
Beschreibung des Produkts
The High Frequency Probe HF77SMKMINIFAKRAm0212G1080MSMPmF (item number 1139613) is designed for reliable transmission of high-frequency signals in test and measurement applications. With a defined impedance of 50 Ω, HF77SMKMINIFAKRAm0212G1080MSMPmF supports controlled signal routing and helps minimize reflections and signal loss at the test interface. The frequency range extends up to 12 GHz, making the probe suitable for demanding high-frequency functional tests. A spring force of 420 cN supports repeatable mechanical contacting over repeated test cycles.