Technical data
| General | |
|---|---|
| Structure | Coaxial Probe |
| Type/family | HF77 |
| Pitch (mm/mil) | 12,0 / 472 |
| Dimensions | |
|---|---|
| Total length (mm) | 30.5 |
| Tip style diameter (mm) | 3.4 |
| Materials and surfaces | |
|---|---|
| Tip style | 16 |
| Tip style material | Beryllium copper |
| Tip style plating | Gold |
| Plunger material | Beryllium copper |
| Plunger plating | Gold |
| Mechanical specifications | |
|---|---|
| Preload (cN) | 280 |
| Spring force (cN) | 420 |
| Nominal travel (mm) | 1.4 |
| Maximum travel (mm) | 2.2 |
| Connection | Plug |
| Electrical specifications | |
|---|---|
| Impedance (ohm) | 50 |
| Frequency (GHz) | 12 |
Graphics
Beschreibung des Produkts
The High Frequency Probe HF77SMKMINIFAKRAm0212G1080MSMPmF (item number 1139613) is designed for reliable transmission of high-frequency signals in test and measurement applications. With a defined impedance of 50 Ω, HF77SMKMINIFAKRAm0212G1080MSMPmF supports controlled signal routing and helps minimize reflections and signal loss at the test interface. The frequency range extends up to 12 GHz, making the probe suitable for demanding high-frequency functional tests. A spring force of 420 cN supports repeatable mechanical contacting over repeated test cycles.