The Fine Pitch Double Plunger Probe FP590D2903S038G035L087 (item number 1023462) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP590D2903S038G035L087 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP590D2903S038G035L087, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP590D2903S038G035L087 includes pitch 0.8 mm / 31 mil, spring force 35 cN, continuous current 2.5 A.
