The Fine Pitch Double Plunger Probe FP420S18B025G040L239AE (item number 1029877) is designed for precise contacting where installation space is limited. Tip style 18 (Conical 30°) targets FP420S18B025G040L239AE at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP420S18B025G040L239AE, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP420S18B025G040L239AE includes pitch 0.6 mm / 25 mil, spring force 40 cN, continuous current 2 A.
