Datos técnicos
| General | |
|---|---|
| Estructura | Double Plunger Probe |
| Tipo/Familia | FP-S |
| Paso (mm/mil) | 0,60 / 25 |
| Temperatura | -45°C...+100°C |
| Definición adicional | AE |
| Dimensiones | |
|---|---|
| Longitud total (mm) | 23.9 |
| Altura sobresaliente (mm) | 4.3 |
| Diámetro del estilo de punta (mm) | 0.25 |
| Diámetro del casquillo (mm) | 0.42 |
| Diámetro del estilo de punta (mm) 2 | 0.25 |
| Materiales y superficies | |
|---|---|
| Estilo de punta | 18 |
| Estilo de punta 2 | 18 |
| Material del émbolo | Beryllium copper |
| Recubrimiento del émbolo | Gold |
| Material del casquillo | Bronze |
| Recubrimiento del casquillo | Gold |
| Material del resorte | Spring steel |
| Recubrimiento del resorte | Gold |
| Material del émbolo 2 | Beryllium copper |
| Recubrimiento del émbolo 2 | Gold |
| Especificaciones mecánicas | |
|---|---|
| Precarga (cN) | 10 |
| Fuerza del resorte (cN) | 40 |
| Recorrido nominal (mm) | 2 |
| Recorrido máximo (mm) | 3 |
| Precisión de punteo +/- (mm) | 0.05 |
| Especificaciones eléctricas | |
|---|---|
| Corriente continua (A) | 2 |
| Resistencia de contacto típica (mΩ) | 150 |
Gráficos
Beschreibung des Produkts
The Fine Pitch Double Plunger Probe FP420S18B025G040L239AE (item number 1029877) is designed for precise contacting where installation space is limited. Tip style 18 (Conical 30°) targets FP420S18B025G040L239AE at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP420S18B025G040L239AE, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP420S18B025G040L239AE includes pitch 0.6 mm / 25 mil, spring force 40 cN, continuous current 2 A.