Technical data
| General | |
|---|---|
| Structure | Double Plunger Probe |
| Type/family | FP-S |
| Pitch (mm/mil) | 0,60 / 25 |
| Temperature | -45°C...+100°C |
| Additional definition | AE |
| Dimensions | |
|---|---|
| Total length (mm) | 23.9 |
| Protrusion height (mm) | 4.3 |
| Tip style diameter (mm) | 0.25 |
| Barrel diameter (mm) | 0.42 |
| Tip style diameter (mm) 2 | 0.25 |
| Materials and surfaces | |
|---|---|
| Tip style | 18 |
| Tip style 2 | 18 |
| Plunger material | Beryllium copper |
| Plunger plating | Gold |
| Barrel material | Bronze |
| Barrel plating | Gold |
| Spring material | Spring steel |
| Spring plating | Gold |
| Plunger material 2 | Beryllium copper |
| Plunger plating 2 | Gold |
| Mechanical specifications | |
|---|---|
| Preload (cN) | 10 |
| Spring force (cN) | 40 |
| Nominal travel (mm) | 2 |
| Maximum travel (mm) | 3 |
| Pointing accuracy +/- (mm) | 0.05 |
| Electrical specifications | |
|---|---|
| Continuous current (A) | 2 |
| Typical contact resistance (mOhm) | 150 |
Graphics
Beschreibung des Produkts
The Fine Pitch Double Plunger Probe FP420S18B025G040L239AE (item number 1029877) is designed for precise contacting where installation space is limited. Tip style 18 (Conical 30°) targets FP420S18B025G040L239AE at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP420S18B025G040L239AE, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP420S18B025G040L239AE includes pitch 0.6 mm / 25 mil, spring force 40 cN, continuous current 2 A.