The Basic Contact Probe F77233S130L200E15H (item number 1169312) is designed for repeated contacting of test points in electronic test fixtures. With tip style 33 (Square lance 38°), F77233S130L200E15H combines ICT/FCT use with a geometry intended for vias and solder pads where the edges can break through residues and oxide layers. F77233S130L200E15H combines a pitch of 2.54 mm / 100 mil with tip style 33 (Square lance 38°) and a tip diameter of 1.3 mm. For F77233S130L200E15H, spring force is 200 cN at a nominal travel of 4 mm. For F77233S130L200E15H, the specified continuous current is 5 A. The final H identifies the high-temperature version; F77233S130L200E15H is suitable for applications up to 200 °C.
