Datos técnicos
| General | |
|---|---|
| Estructura | Basic Contact Probe |
| Tipo/Familia | F772 |
| Paso (mm/mil) | 2,54 / 100 |
| Temperatura | -45°C...+80°C |
| Definición adicional | EXX |
| Dimensiones | |
|---|---|
| Longitud total (mm) | 37 |
| Altura sobresaliente (mm) | 15 |
| Diámetro del estilo de punta (mm) | 1.3 |
| Diámetro del casquillo (mm) | 1.66 |
| Diámetro del collar (mm) | 2.04 |
| Diámetro del anillo de presión (mm) | 2.04 |
| Materiales y superficies | |
|---|---|
| Estilo de punta | 33 |
| Material del émbolo | Steel |
| Recubrimiento del émbolo | Longtime Gold |
| Material del casquillo | Nickel silver |
| Recubrimiento del casquillo | Gold |
| Material del resorte | Spring steel |
| Recubrimiento del resorte | Silver |
| Especificaciones mecánicas | |
|---|---|
| Precarga (cN) | 80 |
| Fuerza del resorte (cN) | 200 |
| Recorrido nominal (mm) | 4 |
| Recorrido máximo (mm) | 5 |
| Precisión de punteo +/- (mm) | 0.08 |
| Especificaciones eléctricas | |
|---|---|
| Corriente continua (A) | 5 |
| Resistencia de contacto típica (mΩ) | 25 |
Gráficos
Beschreibung des Produkts
The Basic Contact Probe F77233S130L200E15H (item number 1169312) is designed for repeated contacting of test points in electronic test fixtures. With tip style 33 (Square lance 38°), F77233S130L200E15H combines ICT/FCT use with a geometry intended for vias and solder pads where the edges can break through residues and oxide layers. F77233S130L200E15H combines a pitch of 2.54 mm / 100 mil with tip style 33 (Square lance 38°) and a tip diameter of 1.3 mm. For F77233S130L200E15H, spring force is 200 cN at a nominal travel of 4 mm. For F77233S130L200E15H, the specified continuous current is 5 A. The final H identifies the high-temperature version; F77233S130L200E15H is suitable for applications up to 200 °C.