The Basic Contact Probe F05017B050G100 (item number 1169809) is designed for repeated contacting of test points in electronic test fixtures. With tip style 17 (Flat stepped), F05017B050G100 combines ICT/FCT use with a geometry intended for solder pads and contact pins. The design combines a pitch of 1.27 mm / 50 mil with tip style 17 (Flat stepped) and a tip diameter of 0.5 mm. For F05017B050G100, spring force is 100 cN at a nominal travel of 4.3 mm. F05017B050G100 is specified for 3 A continuous current.
