Datos técnicos
| General | |
|---|---|
| Estructura | Basic Contact Probe |
| Tipo/Familia | F050 |
| Paso (mm/mil) | 1,27 / 50 |
| Temperatura | -45°C...+80°C |
| Dimensiones | |
|---|---|
| Longitud total (mm) | 43.2 |
| Altura sobresaliente (mm) | 6.9 |
| Diámetro del estilo de punta (mm) | 0.5 |
| Diámetro del casquillo (mm) | 0.78 |
| Materiales y superficies | |
|---|---|
| Estilo de punta | 17 |
| Material del émbolo | Beryllium copper |
| Recubrimiento del émbolo | Gold |
| Material del casquillo | Bronze |
| Recubrimiento del casquillo | Gold |
| Material del resorte | Spring steel |
| Recubrimiento del resorte | Gold |
| Especificaciones mecánicas | |
|---|---|
| Precarga (cN) | 50 |
| Fuerza del resorte (cN) | 100 |
| Recorrido nominal (mm) | 4.3 |
| Recorrido máximo (mm) | 6.4 |
| Precisión de punteo +/- (mm) | 0.05 |
| Especificaciones eléctricas | |
|---|---|
| Corriente continua (A) | 3 |
| Resistencia de contacto típica (mΩ) | 20 |
Gráficos
Beschreibung des Produkts
The Basic Contact Probe F05017B050G100 (item number 1169809) is designed for repeated contacting of test points in electronic test fixtures. With tip style 17 (Flat stepped), F05017B050G100 combines ICT/FCT use with a geometry intended for solder pads and contact pins. The design combines a pitch of 1.27 mm / 50 mil with tip style 17 (Flat stepped) and a tip diameter of 0.5 mm. For F05017B050G100, spring force is 100 cN at a nominal travel of 4.3 mm. F05017B050G100 is specified for 3 A continuous current.