Technical data
| General | |
|---|---|
| Structure | Basic Contact Probe |
| Type/family | F050 |
| Pitch (mm/mil) | 1,27 / 50 |
| Temperature | -45°C...+80°C |
| Dimensions | |
|---|---|
| Total length (mm) | 43.2 |
| Protrusion height (mm) | 6.9 |
| Tip style diameter (mm) | 0.5 |
| Barrel diameter (mm) | 0.78 |
| Materials and surfaces | |
|---|---|
| Tip style | 17 |
| Plunger material | Beryllium copper |
| Plunger plating | Gold |
| Barrel material | Bronze |
| Barrel plating | Gold |
| Spring material | Spring steel |
| Spring plating | Gold |
| Mechanical specifications | |
|---|---|
| Preload (cN) | 50 |
| Spring force (cN) | 100 |
| Nominal travel (mm) | 4.3 |
| Maximum travel (mm) | 6.4 |
| Pointing accuracy +/- (mm) | 0.05 |
| Electrical specifications | |
|---|---|
| Continuous current (A) | 3 |
| Typical contact resistance (mOhm) | 20 |
Graphics
Beschreibung des Produkts
The Basic Contact Probe F05017B050G100 (item number 1169809) is designed for repeated contacting of test points in electronic test fixtures. With tip style 17 (Flat stepped), F05017B050G100 combines ICT/FCT use with a geometry intended for solder pads and contact pins. The design combines a pitch of 1.27 mm / 50 mil with tip style 17 (Flat stepped) and a tip diameter of 0.5 mm. For F05017B050G100, spring force is 100 cN at a nominal travel of 4.3 mm. F05017B050G100 is specified for 3 A continuous current.