The Basic Contact Probe F77217B200G300 (item number 1008821) is a spring-loaded probe for temporary electrical contact with test points. With tip style 17 (Flat stepped), F77217B200G300 combines ICT/FCT use with a geometry intended for solder pads and contact pins. F77217B200G300 combines a pitch of 2.54 mm / 100 mil with tip style 17 (Flat stepped) and a tip diameter of 2 mm. F77217B200G300 operates with 300 cN spring force and 4 mm nominal travel. F77217B200G300 is rated for 5 A continuous current with a typical contact resistance of 25 mΩ. The plunger in F77217B200G300 is made of beryllium copper and is gold-plated.
