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F77217B200G300 Perspective 1 F77217B200G300 Perspective 2

Basic Contact Probes (100 mil) F77217B200G300

Item number 1008821

Technical data sheet

Quantity

Technical data

General
Structure Basic Contact Probe
Type/family F772
Pitch (mm/mil) 2,54 / 100
Temperature -45°C...+80°C
Dimensions
Total length (mm) 32
Protrusion height (mm) 10
Tip style diameter (mm) 2
Barrel diameter (mm) 1.66
Collar diameter (mm) 2.05
Press ring diameter (mm) 2.05
Materials and surfaces
Tip style 17
Plunger material Beryllium copper
Plunger plating Gold
Barrel material Nickel silver
Barrel plating Gold
Spring material Spring steel
Spring plating Silver
Mechanical specifications
Preload (cN) 60
Spring force (cN) 300
Nominal travel (mm) 4
Maximum travel (mm) 5
Pointing accuracy +/- (mm) 0.08
Electrical specifications
Continuous current (A) 5
Typical contact resistance (mOhm) 25

Graphics

F77217B200G300 Family designation F77217B200G300 Tip style 1

Beschreibung des Produkts

The Basic Contact Probe F77217B200G300 (item number 1008821) is a spring-loaded probe for temporary electrical contact with test points. With tip style 17 (Flat stepped), F77217B200G300 combines ICT/FCT use with a geometry intended for solder pads and contact pins. F77217B200G300 combines a pitch of 2.54 mm / 100 mil with tip style 17 (Flat stepped) and a tip diameter of 2 mm. F77217B200G300 operates with 300 cN spring force and 4 mm nominal travel. F77217B200G300 is rated for 5 A continuous current with a typical contact resistance of 25 mΩ. The plunger in F77217B200G300 is made of beryllium copper and is gold-plated.