The Basic Contact Probe F76818B060G130 (item number 1001613) is a spring-loaded probe for temporary electrical contact with test points. With tip style 18 (Conical 30°), F76818B060G130 combines ICT/FCT use with a geometry intended for solder pads and vias. F76818B060G130 combines a pitch of 1.27 mm / 50 mil with tip style 18 (Conical 30°) and a tip diameter of 0.6 mm. For F76818B060G130, spring force is 130 cN at a nominal travel of 3.2 mm. F76818B060G130 is rated for 3 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F76818B060G130 is made of beryllium copper and is gold-plated.