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Basic Contact Probes (50 mil) F76818B060G130

Item number 1001613

Technical data sheet

Quantity

Technical data

General
Structure Basic Contact Probe
Type/family F768
Pitch (mm/mil) 1,27 / 50
Temperature -45°C...+80°C
Dimensions
Total length (mm) 37
Protrusion height (mm) 13.6
Tip style diameter (mm) 0.6
Barrel diameter (mm) 0.79
Materials and surfaces
Tip style 18
Plunger material Beryllium copper
Plunger plating Gold
Barrel material Bronze
Barrel plating Gold
Spring material Spring steel
Spring plating Silver
Mechanical specifications
Preload (cN) 50
Spring force (cN) 130
Nominal travel (mm) 3.2
Maximum travel (mm) 4
Pointing accuracy +/- (mm) 0.07
Electrical specifications
Continuous current (A) 3
Typical contact resistance (mOhm) 20

Graphics

F76818B060G130 Family designation F76818B060G130 Tip style 1

Beschreibung des Produkts

The Basic Contact Probe F76818B060G130 (item number 1001613) is a spring-loaded probe for temporary electrical contact with test points. With tip style 18 (Conical 30°), F76818B060G130 combines ICT/FCT use with a geometry intended for solder pads and vias. F76818B060G130 combines a pitch of 1.27 mm / 50 mil with tip style 18 (Conical 30°) and a tip diameter of 0.6 mm. For F76818B060G130, spring force is 130 cN at a nominal travel of 3.2 mm. F76818B060G130 is rated for 3 A continuous current with a typical contact resistance of 20 mΩ. The plunger in F76818B060G130 is made of beryllium copper and is gold-plated.