The Fine Pitch Double Plunger Probe FP580D0329B030G020L059 (item number 1003844) is designed for precise contacting where installation space is limited. Tip style 03 (Conical 60°) targets FP580D0329B030G020L059 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP580D0329B030G020L059, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.75 mm / 30 mil, spring force 20 cN, continuous current 3.5 A.
