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FP580D0329B030G020L059 Perspective 1 FP580D0329B030G020L059 Perspective 2

Fine Pitch Probes (> 500 µm) FP580D0329B030G020L059

Item number 1003844

Technical data sheet

Quantity

Technical data

General
Structure Double Plunger Probe
Type/family FP-D
Pitch (mm/mil) 0,75 / 30
Temperature -45°C...+100°C
Dimensions
Total length (mm) 5.9
Protrusion height (mm) 0.8
Tip style diameter (mm) 0.3
Barrel diameter (mm) 0.58
Tip style diameter (mm) 2 0.3
Materials and surfaces
Tip style 03
Tip style 2 29
Plunger material Beryllium copper
Plunger plating Gold
Barrel material Bronze
Barrel plating Gold
Spring material Spring steel
Spring plating Silver
Plunger material 2 Beryllium copper
Plunger plating 2 Gold
Mechanical specifications
Preload (cN) 10
Spring force (cN) 20
Nominal travel (mm) 0.5
Maximum travel (mm) 1
Pointing accuracy +/- (mm) 0.09
Electrical specifications
Continuous current (A) 3.5
Typical contact resistance (mOhm) 50

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FP580D0329B030G020L059 Family designation FP580D0329B030G020L059 Tip style 1 FP580D0329B030G020L059 Tip style 2

Beschreibung des Produkts

The Fine Pitch Double Plunger Probe FP580D0329B030G020L059 (item number 1003844) is designed for precise contacting where installation space is limited. Tip style 03 (Conical 60°) targets FP580D0329B030G020L059 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP580D0329B030G020L059, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.75 mm / 30 mil, spring force 20 cN, continuous current 3.5 A.