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F77206B200G150E15 Perspective 1 F77206B200G150E15 Perspective 2

标准探针 (100 mil) F77206B200G150E15

商品编号 1008918

技术数据表

数量

技术数据

一般信息
结构 Basic Contact Probe
类型/系列 F772
间距(mm/mil) 2,54 / 100
温度 -45°C...+80°C
附加定义 EXX
尺寸
总长度 (mm) 37
突出高度(毫米) 15
针头直径 (mm) 2
针管直径 (mm) 1.66
领圈直径 (mm) 2.04
压环直径 (mm) 2.04
材料和表面
头型 06
柱塞材料 Beryllium copper
柱塞镀层 Gold
针管材料 Nickel silver
针管镀层 Gold
弹簧材料 Spring steel
弹簧镀层 Silver
机械规格
预紧力(cN) 20
弹力 (cN) 150
标准行程 (mm) 4
最大行程 (mm) 5
定位精度 +/- (mm) 0.08
电气规格
电流 (A) 5
接触电阻(mOhm) 25

图形

F77206B200G150E15 家族图示 F77206B200G150E15 头型 1

Beschreibung des Produkts

F77206B200G150E15 (item number 1008918) is a Basic Contact Probe for repeatable temporary connections between the test system and a test point. With tip style 06 (Serrated stepped), F77206B200G150E15 combines ICT/FCT use with a geometry intended for wires, pins and wire-wrap posts; the geometry is also suited to slightly bent contacts. F77206B200G150E15 combines a pitch of 2.54 mm / 100 mil with tip style 06 (Serrated stepped) and a tip diameter of 2 mm. F77206B200G150E15 operates with 150 cN spring force and 4 mm nominal travel. F77206B200G150E15 is rated for 5 A continuous current with a typical contact resistance of 25 mΩ. The plunger in F77206B200G150E15 is made of beryllium copper and is gold-plated.