The Basic Contact Probe F10017B200G200H (item number 1015247) is a spring-loaded probe for temporary electrical contact with test points. With tip style 17 (Flat stepped), F10017B200G200H combines ICT/FCT use with a geometry intended for solder pads and contact pins. F10017B200G200H combines a pitch of 2.54 mm / 100 mil with tip style 17 (Flat stepped) and a tip diameter of 2 mm. For F10017B200G200H, spring force is 200 cN at a nominal travel of 4.3 mm. F10017B200G200H is rated for 5 A continuous current with a typical contact resistance of 100 mΩ. The plunger in F10017B200G200H is made of beryllium copper and is gold-plated. The final H identifies the high-temperature version; F10017B200G200H is suitable for applications up to 200 °C.
