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F78512B230G300E25 Perspective 1 F78512B230G300E25 Perspective 2

标准探针 (138 mil) F78512B230G300E25

商品编号 1020423

技术数据表

数量

技术数据

一般信息
结构 Basic Contact Probe
类型/系列 F785
间距(mm/mil) 3,50 / 138
温度 -45°C...+80°C
附加定义 EXX
尺寸
总长度 (mm) 47
突出高度(毫米) 25
针头直径 (mm) 2.3
针管直径 (mm) 2.65
领圈直径 (mm) 3.01
压环直径 (mm) 3.01
材料和表面
头型 12
柱塞材料 Beryllium copper
柱塞镀层 Gold
针管材料 Bronze
针管镀层 Gold
弹簧材料 Spring steel
弹簧镀层 Silver
机械规格
预紧力(cN) 80
弹力 (cN) 300
标准行程 (mm) 6.4
最大行程 (mm) 8
定位精度 +/- (mm) 0.1
电气规格
电流 (A) 10
接触电阻(mOhm) 25

图形

F78512B230G300E25 家族图示 F78512B230G300E25 头型 1

Beschreibung des Produkts

The Basic Contact Probe F78512B230G300E25 (item number 1020423) is a spring-loaded probe for temporary electrical contact with test points. With tip style 12 (Spherical stepped), F78512B230G300E25 combines ICT/FCT use with a geometry intended for clean contact surfaces where marking or scratching should be minimized. F78512B230G300E25 combines a pitch of 3.5 mm / 138 mil with tip style 12 (Spherical stepped) and a tip diameter of 2.3 mm. F78512B230G300E25 operates with 300 cN spring force and 6.4 mm nominal travel. F78512B230G300E25 is rated for 10 A continuous current with a typical contact resistance of 25 mΩ. The plunger in F78512B230G300E25 is made of beryllium copper and is gold-plated.