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F78512B230G300E25 Perspective 1 F78512B230G300E25 Perspective 2

Basic Contact Probes (138 mil) F78512B230G300E25

Item number 1020423

Technical data sheet

Quantity

Technical data

General
Structure Basic Contact Probe
Type/family F785
Pitch (mm/mil) 3,50 / 138
Temperature -45°C...+80°C
Additional definition EXX
Dimensions
Total length (mm) 47
Protrusion height (mm) 25
Tip style diameter (mm) 2.3
Barrel diameter (mm) 2.65
Collar diameter (mm) 3.01
Press ring diameter (mm) 3.01
Materials and surfaces
Tip style 12
Plunger material Beryllium copper
Plunger plating Gold
Barrel material Bronze
Barrel plating Gold
Spring material Spring steel
Spring plating Silver
Mechanical specifications
Preload (cN) 80
Spring force (cN) 300
Nominal travel (mm) 6.4
Maximum travel (mm) 8
Pointing accuracy +/- (mm) 0.1
Electrical specifications
Continuous current (A) 10
Typical contact resistance (mOhm) 25

Graphics

F78512B230G300E25 Family designation F78512B230G300E25 Tip style 1

Beschreibung des Produkts

The Basic Contact Probe F78512B230G300E25 (item number 1020423) is a spring-loaded probe for temporary electrical contact with test points. With tip style 12 (Spherical stepped), F78512B230G300E25 combines ICT/FCT use with a geometry intended for clean contact surfaces where marking or scratching should be minimized. F78512B230G300E25 combines a pitch of 3.5 mm / 138 mil with tip style 12 (Spherical stepped) and a tip diameter of 2.3 mm. F78512B230G300E25 operates with 300 cN spring force and 6.4 mm nominal travel. F78512B230G300E25 is rated for 10 A continuous current with a typical contact resistance of 25 mΩ. The plunger in F78512B230G300E25 is made of beryllium copper and is gold-plated.