As a Basic Contact Probe, F56317B170G180 (item number 1053967) establishes a spring-loaded electrical connection to the test point. With tip style 17 (Flat stepped), F56317B170G180 combines ICT/FCT use with a geometry intended for solder pads and contact pins. The design combines a pitch of 3 mm / 118 mil with tip style 17 (Flat stepped) and a tip diameter of 1.7 mm. For F56317B170G180, spring force is 180 cN at a nominal travel of 4.3 mm. The electrical rating of F56317B170G180 combines 6 A continuous current with 100 mΩ typical contact resistance. The plunger in F56317B170G180 is made of beryllium copper and is gold-plated.
