The Fine Pitch Probe FP580D1111B030G060L059HS1 (item number 1093730) is designed for precise contacting at very small pitches. Tip style 11 (Spherical) targets FP580D1111B030G060L059HS1 at clean, sensitive contact surfaces; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP580D1111B030G060L059HS1, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. The design combines a pitch of 0.75 mm / 30 mil with tip style 11 (Spherical) and a tip diameter of 0.3 mm. FP580D1111B030G060L059HS1 operates with 60 cN spring force and 0.5 mm nominal travel. The continuous-current rating of FP580D1111B030G060L059HS1 is 3.5 A.
