The Basic Contact Probe F05015B090G150 (item number 1134074) is designed for repeated contacting of test points in electronic test fixtures. With tip style 15 (Triangular 45° stepped), F05015B090G150 combines ICT/FCT use with a geometry intended for vias and solder pads where sharp edges can penetrate flux residues or oxide layers. F05015B090G150 combines a pitch of 1.27 mm / 50 mil with tip style 15 (Triangular 45° stepped) and a tip diameter of 0.9 mm. For F05015B090G150, spring force is 150 cN at a nominal travel of 4.3 mm. The continuous-current rating of F05015B090G150 is 3 A.
