As a Basic Contact Probe, F10017B150G200 (item number 1134328) establishes a spring-loaded electrical connection to the test point. With tip style 17 (Flat stepped), F10017B150G200 combines ICT/FCT use with a geometry intended for solder pads and contact pins. The design combines a pitch of 4.7 mm / 185 mil with tip style 17 (Flat stepped) and a tip diameter of 1.5 mm. F10017B150G200 operates with 200 cN spring force and 4.3 mm nominal travel. The plunger in F10017B150G200 is made of beryllium copper and is gold-plated.
