Technical data
| General | |
|---|---|
| Structure | Basic Contact Probe |
| Type/family | F100 |
| Pitch (mm/mil) | 4,70 / 185 |
| Temperature | -45°C...+80°C |
| Dimensions | |
|---|---|
| Total length (mm) | 33.3 |
| Protrusion height (mm) | 8.5 |
| Tip style diameter (mm) | 1.5 |
| Barrel diameter (mm) | 1.37 |
| Materials and surfaces | |
|---|---|
| Tip style | 17 |
| Plunger material | Beryllium copper |
| Plunger plating | Gold |
| Barrel material | Bronze |
| Barrel plating | Gold |
| Spring material | Spring steel |
| Spring plating | Silver |
| Mechanical specifications | |
|---|---|
| Preload (cN) | 80 |
| Spring force (cN) | 200 |
| Nominal travel (mm) | 4.3 |
| Maximum travel (mm) | 6.4 |
| Electrical specifications | |
|---|---|
| Typical contact resistance (mOhm) | 20 |
Graphics
Beschreibung des Produkts
As a Basic Contact Probe, F10017B150G200 (item number 1134328) establishes a spring-loaded electrical connection to the test point. With tip style 17 (Flat stepped), F10017B150G200 combines ICT/FCT use with a geometry intended for solder pads and contact pins. The design combines a pitch of 4.7 mm / 185 mil with tip style 17 (Flat stepped) and a tip diameter of 1.5 mm. F10017B150G200 operates with 200 cN spring force and 4.3 mm nominal travel. The plunger in F10017B150G200 is made of beryllium copper and is gold-plated.