The Basic Contact Probe HCF56611B195G500 (item number 1141605) is designed for repeated contacting of test points in electronic test fixtures. With tip style 11 (Spherical), HCF56611B195G500 combines ICT/FCT use with a geometry intended for clean contact surfaces where marking or scratching should be minimized. The design combines a pitch of 4.5 mm / 177 mil with tip style 11 (Spherical) and a tip diameter of 1.95 mm. For HCF56611B195G500, spring force is 500 cN at a nominal travel of 4.3 mm. The continuous-current rating of HCF56611B195G500 is 40 A.
