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Basic Contact Probes HCF56611B195G500

Item number 1141605

Technical data sheet

Quantity

Technical data

General
Structure Basic Contact Probe
Type/family HCF566
Pitch (mm/mil) 4,50/ 177
Temperature -45°C...+200°C
Dimensions
Total length (mm) 36.1
Protrusion height (mm) 8.9
Tip style diameter (mm) 1.95
Barrel diameter (mm) 3.18
Materials and surfaces
Tip style 11
Plunger material Beryllium copper
Plunger plating Gold
Barrel material Bronze
Barrel plating Gold
Spring material High-grade steel
Spring plating Uncoated
Mechanical specifications
Preload (cN) 300
Spring force (cN) 500
Nominal travel (mm) 4.3
Maximum travel (mm) 6.4
Pointing accuracy +/- (mm) 0.1
Electrical specifications
Continuous current (A) 40
Typical contact resistance (mOhm) 15

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HCF56611B195G500 Family designation HCF56611B195G500 Diagram

Beschreibung des Produkts

The Basic Contact Probe HCF56611B195G500 (item number 1141605) is designed for repeated contacting of test points in electronic test fixtures. With tip style 11 (Spherical), HCF56611B195G500 combines ICT/FCT use with a geometry intended for clean contact surfaces where marking or scratching should be minimized. The design combines a pitch of 4.5 mm / 177 mil with tip style 11 (Spherical) and a tip diameter of 1.95 mm. For HCF56611B195G500, spring force is 500 cN at a nominal travel of 4.3 mm. The continuous-current rating of HCF56611B195G500 is 40 A.