F58828B130G200 (item number 1170011) provides a Basic Contact Probe for defined electrical contact in ICT and Functional Test fixtures. With tip style 28 (4-point crown stepped), F58828B130G200 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F58828B130G200 combines a pitch of 2.54 mm / 100 mil with tip style 28 (4-point crown stepped) and a tip diameter of 1.3 mm. F58828B130G200 operates with 200 cN spring force and 9.3 mm nominal travel. F58828B130G200 is specified for 5 A continuous current.
