Technical data
| General | |
|---|---|
| Structure | Basic Contact Probe |
| Type/family | F588 |
| Pitch (mm/mil) | 2,54 / 100 |
| Temperature | -45°C...+80°C |
| Dimensions | |
|---|---|
| Total length (mm) | 39 |
| Protrusion height (mm) | 14.1 |
| Tip style diameter (mm) | 1.3 |
| Barrel diameter (mm) | 1.37 |
| Materials and surfaces | |
|---|---|
| Tip style | 28 |
| Plunger material | Beryllium copper |
| Plunger plating | Gold |
| Barrel material | Bronze |
| Barrel plating | Gold |
| Spring material | Spring steel |
| Spring plating | Silver |
| Mechanical specifications | |
|---|---|
| Preload (cN) | 75 |
| Spring force (cN) | 200 |
| Nominal travel (mm) | 9.3 |
| Maximum travel (mm) | 11.7 |
| Pointing accuracy +/- (mm) | 0.1 |
| Electrical specifications | |
|---|---|
| Continuous current (A) | 5 |
| Typical contact resistance (mOhm) | 30 |
Graphics
Beschreibung des Produkts
F58828B130G200 (item number 1170011) provides a Basic Contact Probe for defined electrical contact in ICT and Functional Test fixtures. With tip style 28 (4-point crown stepped), F58828B130G200 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F58828B130G200 combines a pitch of 2.54 mm / 100 mil with tip style 28 (4-point crown stepped) and a tip diameter of 1.3 mm. F58828B130G200 operates with 200 cN spring force and 9.3 mm nominal travel. F58828B130G200 is specified for 5 A continuous current.