Datos técnicos
| General | |
|---|---|
| Estructura | Double Plunger Probe |
| Tipo/Familia | FP-DF |
| Paso (mm/mil) | 0,30 / 12 |
| Temperatura | -45°C...+120°C |
| Dimensiones | |
|---|---|
| Longitud total (mm) | 4.5 |
| Altura sobresaliente (mm) | 0.65 |
| Diámetro del estilo de punta (mm) | 0.2 |
| Diámetro del casquillo (mm) | 0.2 |
| Diámetro del estilo de punta (mm) 2 | 0.1 |
| Materiales y superficies | |
|---|---|
| Estilo de punta | 71 |
| Estilo de punta 2 | 11 |
| Material del émbolo | Beryllium copper |
| Recubrimiento del émbolo | Gold |
| Material del casquillo | Nickel |
| Recubrimiento del casquillo | Gold |
| Material del resorte | Spring steel |
| Recubrimiento del resorte | Gold |
| Material del émbolo 2 | Beryllium copper |
| Recubrimiento del émbolo 2 | Gold |
| Especificaciones mecánicas | |
|---|---|
| Precarga (cN) | 10 |
| Fuerza del resorte (cN) | 15 |
| Recorrido nominal (mm) | 0.3 |
| Recorrido máximo (mm) | 0.45 |
| Especificaciones eléctricas | |
|---|---|
| Corriente continua (A) | 0.7 |
| Resistencia de contacto típica (mΩ) | 500 |
| Frecuencia (GHz) | 18.8 |
Gráficos
Beschreibung des Produkts
The Fine Pitch Double Plunger Probe FP200DF7111B020G015L045 (item number 1024610) is designed for precise contacting where installation space is limited. Tip style 71 (Half Moon) targets FP200DF7111B020G015L045 at Kelvin measurements at very small pitches with anti-rotation alignment provided by the hole pattern; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP200DF7111B020G015L045, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.3 mm / 12 mil, spring force 15 cN, continuous current 0.7 A.