The Fine Pitch Double Plunger Probe FP280DF2901P019U010L033 (item number 1120799) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP280DF2901P019U010L033 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP280DF2901P019U010L033, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.35 mm / 14 mil, spring force 10 cN, continuous current 2.5 A.
