The Fine Pitch Probe FP380D0301B025P023L032 (item number 1151224) is designed for precise contacting at very small pitches. Tip style 03 (Conical 60°) targets FP380D0301B025P023L032 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP380D0301B025P023L032, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. The design combines a pitch of 0.5 mm / 20 mil with tip style 03 (Conical 60°) and a tip diameter of 0.25 mm. Spring force is 23 cN at a nominal travel of 0.55 mm. The specified continuous current is 1.4 A.
