The Basic Contact Probe F56106B100G150 (item number 1168361) is designed for repeated contacting of test points in electronic test fixtures. With tip style 06 (Serrated stepped), F56106B100G150 combines ICT/FCT use with a geometry intended for wires, pins and wire-wrap posts; the geometry is also suited to slightly bent contacts. F56106B100G150 combines a pitch of 1.9 mm / 75 mil with tip style 06 (Serrated stepped) and a tip diameter of 1 mm. F56106B100G150 operates with 150 cN spring force and 2.4 mm nominal travel. For F56106B100G150, the specified continuous current is 4 A.
