Technical data
| General | |
|---|---|
| Structure | Basic Contact Probe |
| Type/family | F561 |
| Pitch (mm/mil) | 1,90 / 75 |
| Temperature | -45°C...+80°C |
| Dimensions | |
|---|---|
| Total length (mm) | 17 |
| Protrusion height (mm) | 4.5 |
| Tip style diameter (mm) | 1 |
| Barrel diameter (mm) | 1 |
| Materials and surfaces | |
|---|---|
| Tip style | 06 |
| Plunger material | Beryllium copper |
| Plunger plating | Gold |
| Barrel material | Bronze |
| Barrel plating | Gold |
| Spring material | Spring steel |
| Spring plating | Silver |
| Mechanical specifications | |
|---|---|
| Preload (cN) | 70 |
| Spring force (cN) | 150 |
| Nominal travel (mm) | 2.4 |
| Maximum travel (mm) | 3 |
| Pointing accuracy +/- (mm) | 0.05 |
| Electrical specifications | |
|---|---|
| Continuous current (A) | 4 |
| Typical contact resistance (mOhm) | 20 |
Graphics
Beschreibung des Produkts
The Basic Contact Probe F56106B100G150 (item number 1168361) is designed for repeated contacting of test points in electronic test fixtures. With tip style 06 (Serrated stepped), F56106B100G150 combines ICT/FCT use with a geometry intended for wires, pins and wire-wrap posts; the geometry is also suited to slightly bent contacts. F56106B100G150 combines a pitch of 1.9 mm / 75 mil with tip style 06 (Serrated stepped) and a tip diameter of 1 mm. F56106B100G150 operates with 150 cN spring force and 2.4 mm nominal travel. For F56106B100G150, the specified continuous current is 4 A.