Datos técnicos
| General | |
|---|---|
| Estructura | Double Plunger Probe |
| Tipo/Familia | FP-DF |
| Paso (mm/mil) | 0,30 / 12 |
| Temperatura | -45°C...+120°C |
| Dimensiones | |
|---|---|
| Longitud total (mm) | 4.5 |
| Altura sobresaliente (mm) | 0.65 |
| Diámetro del estilo de punta (mm) | 0.2 |
| Diámetro del casquillo (mm) | 0.2 |
| Diámetro del estilo de punta (mm) 2 | 0.1 |
| Materiales y superficies | |
|---|---|
| Estilo de punta | 71 |
| Estilo de punta 2 | 11 |
| Material del émbolo | Palladium |
| Recubrimiento del émbolo | Uncoated |
| Material del casquillo | Nickel |
| Recubrimiento del casquillo | Gold |
| Material del resorte | Spring steel |
| Recubrimiento del resorte | Gold |
| Material del émbolo 2 | Beryllium copper |
| Recubrimiento del émbolo 2 | Gold |
| Especificaciones mecánicas | |
|---|---|
| Precarga (cN) | 10 |
| Fuerza del resorte (cN) | 15 |
| Recorrido nominal (mm) | 0.3 |
| Recorrido máximo (mm) | 0.45 |
| Especificaciones eléctricas | |
|---|---|
| Corriente continua (A) | 0.7 |
| Resistencia de contacto típica (mΩ) | 500 |
| Frecuencia (GHz) | 18.8 |
Gráficos
Beschreibung des Produkts
For high-density contacting, FP200DF7111P020U015L045 (item number 1030202) provides a compact spring-loaded probe solution. Tip style 71 (Half Moon) targets FP200DF7111P020U015L045 at Kelvin measurements at very small pitches with anti-rotation alignment provided by the hole pattern; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP200DF7111P020U015L045, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. The design combines a pitch of 0.3 mm / 12 mil with tip style 71 (Half Moon) and a tip diameter of 0.2 mm. Spring force is 15 cN at a nominal travel of 0.3 mm. The specified continuous current is 0.7 A.