Données techniques
| Généralités | |
|---|---|
| Structure | Double Plunger Probe |
| Type/famille | FP-DF |
| Pas (mm/mil) | 0,30 / 12 |
| Température | -45°C...+120°C |
| Dimensions | |
|---|---|
| Longueur totale (mm) | 4.5 |
| Hauteur hors tout (mm) | 0.65 |
| Diamètre du style de pointe (mm) | 0.2 |
| Diamètre du fût (mm) | 0.2 |
| Diamètre du style de pointe (mm) 2 | 0.1 |
| Matériaux et surfaces | |
|---|---|
| Style de pointe | 71 |
| Style de pointe 2 | 11 |
| Matériau du piston | Palladium |
| Revêtement du piston | Uncoated |
| Matériau du fût | Nickel |
| Revêtement du fût | Gold |
| Matériau du ressort | Spring steel |
| Revêtement du ressort | Gold |
| Matériau du piston 2 | Beryllium copper |
| Revêtement du piston 2 | Gold |
| Spécifications mécaniques | |
|---|---|
| Précontrainte (cN) | 10 |
| Force du ressort (cN) | 15 |
| Course nominale (mm) | 0.3 |
| Course maximale (mm) | 0.45 |
| Spécifications électriques | |
|---|---|
| Courant continu (A) | 0.7 |
| Résistance de contact typique (mΩ) | 500 |
| Fréquence (GHz) | 18.8 |
Graphiques
Beschreibung des Produkts
For high-density contacting, FP200DF7111P020U015L045 (item number 1030202) provides a compact spring-loaded probe solution. Tip style 71 (Half Moon) targets FP200DF7111P020U015L045 at Kelvin measurements at very small pitches with anti-rotation alignment provided by the hole pattern; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP200DF7111P020U015L045, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. The design combines a pitch of 0.3 mm / 12 mil with tip style 71 (Half Moon) and a tip diameter of 0.2 mm. Spring force is 15 cN at a nominal travel of 0.3 mm. The specified continuous current is 0.7 A.