For high-density contacting, FP200DF7111P020U015L045 (item number 1030202) provides a compact spring-loaded probe solution. Tip style 71 (Half Moon) targets FP200DF7111P020U015L045 at Kelvin measurements at very small pitches with anti-rotation alignment provided by the hole pattern; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP200DF7111P020U015L045, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. The design combines a pitch of 0.3 mm / 12 mil with tip style 71 (Half Moon) and a tip diameter of 0.2 mm. Spring force is 15 cN at a nominal travel of 0.3 mm. The specified continuous current is 0.7 A.
