Technical data
| General | |
|---|---|
| Structure | Double Plunger Probe |
| Type/family | FP-DF |
| Pitch (mm/mil) | 0,30 / 12 |
| Temperature | -45°C...+120°C |
| Dimensions | |
|---|---|
| Total length (mm) | 4.5 |
| Protrusion height (mm) | 0.65 |
| Tip style diameter (mm) | 0.2 |
| Barrel diameter (mm) | 0.2 |
| Tip style diameter (mm) 2 | 0.1 |
| Materials and surfaces | |
|---|---|
| Tip style | 71 |
| Tip style 2 | 11 |
| Plunger material | Palladium |
| Plunger plating | Uncoated |
| Barrel material | Nickel |
| Barrel plating | Gold |
| Spring material | Spring steel |
| Spring plating | Gold |
| Plunger material 2 | Beryllium copper |
| Plunger plating 2 | Gold |
| Mechanical specifications | |
|---|---|
| Preload (cN) | 10 |
| Spring force (cN) | 15 |
| Nominal travel (mm) | 0.3 |
| Maximum travel (mm) | 0.45 |
| Electrical specifications | |
|---|---|
| Continuous current (A) | 0.7 |
| Typical contact resistance (mOhm) | 500 |
| Frequency (GHz) | 18.8 |
Graphics
Beschreibung des Produkts
For high-density contacting, FP200DF7111P020U015L045 (item number 1030202) provides a compact spring-loaded probe solution. Tip style 71 (Half Moon) targets FP200DF7111P020U015L045 at Kelvin measurements at very small pitches with anti-rotation alignment provided by the hole pattern; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP200DF7111P020U015L045, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. The design combines a pitch of 0.3 mm / 12 mil with tip style 71 (Half Moon) and a tip diameter of 0.2 mm. Spring force is 15 cN at a nominal travel of 0.3 mm. The specified continuous current is 0.7 A.