Datos técnicos
| General | |
|---|---|
| Estructura | Double Plunger Probe |
| Tipo/Familia | FP-DF |
| Paso (mm/mil) | 0,75 / 30 |
| Temperatura | -45°C...+150°C |
| Dimensiones | |
|---|---|
| Longitud total (mm) | 5.84 |
| Altura sobresaliente (mm) | 3 |
| Diámetro del estilo de punta (mm) | 0.45 |
| Diámetro del casquillo (mm) | 0.52 |
| Diámetro del collar (mm) | 0.64 |
| Diámetro del estilo de punta (mm) 2 | 0.28 |
| Materiales y superficies | |
|---|---|
| Estilo de punta | 29 |
| Estilo de punta 2 | 11 |
| Material del émbolo | Beryllium copper |
| Recubrimiento del émbolo | Defensive |
| Material del casquillo | Bronze |
| Recubrimiento del casquillo | Gold |
| Material del resorte | High-grade steel |
| Recubrimiento del resorte | Gold |
| Material del émbolo 2 | Beryllium copper |
| Recubrimiento del émbolo 2 | Gold |
| Especificaciones mecánicas | |
|---|---|
| Precarga (cN) | 5 |
| Fuerza del resorte (cN) | 42 |
| Recorrido nominal (mm) | 0.75 |
| Recorrido máximo (mm) | 0.9 |
| Especificaciones eléctricas | |
|---|---|
| Corriente continua (A) | 5 |
| Resistencia de contacto típica (mΩ) | 50 |
| Frecuencia (GHz) | 6 |
Gráficos
Beschreibung des Produkts
The Fine Pitch Double Plunger Probe FP520DF2911B045P042L058 (item number 1142380) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP520DF2911B045P042L058 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP520DF2911B045P042L058, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.75 mm / 30 mil, spring force 42 cN, continuous current 5 A.