The Fine Pitch Double Plunger Probe FP520DF2911B045P042L058 (item number 1142380) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP520DF2911B045P042L058 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP520DF2911B045P042L058, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.75 mm / 30 mil, spring force 42 cN, continuous current 5 A.
