F10014S150L200H (item number 1013479) is a Basic Contact Probe for repeatable temporary connections between the test system and a test point. With tip style 14 (4-point crown stepped (self-cleaning)), F10014S150L200H combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F10014S150L200H combines a pitch of 2.54 mm / 100 mil with tip style 14 (4-point crown stepped (self-cleaning)) and a tip diameter of 1.5 mm. F10014S150L200H operates with 200 cN spring force and 4.3 mm nominal travel. F10014S150L200H is rated for 5 A continuous current with a typical contact resistance of 100 mΩ. The plunger in F10014S150L200H is made of steel and uses Longtime Gold plating. The final H identifies the high-temperature version; F10014S150L200H is suitable for applications up to 200 °C.
