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FEINMETALL Probe Cards

Probe Cards Always a good card to play

Much more than just a test tool: we offer a comprehensive range of services for probe cards.

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Highest application range from -55°C to 180°C
High frequencies
up to 100Ghz
User-friendly
Maintenance & Repair
Maximum performance plus maximum operating time

Our portfolio

Flexible solutions with added value: We offer leading technological solutions including comprehensive support.

FEINMETALL Probe Cards: ViProbe®
Probe Cards ViProbe®

ViProbe® – the proven vertical test card solution for the semiconductor industry. Adaptable, versatile, and particularly easy to maintain thanks to simple repairs – for minimal downtime and reduced costs.

FEINMETALL Probe Cards: ViProbe® II
Probe Cards ViProbe® II

The ViProbe® II expands the proven ViProbe® with options for extending service life and improving safety for the DUT. The vertical test card solution offers high reliability, excellent signal integrity, and optimal protection for demanding wafer tests.

FEINMETALL Probe Cards: LiProbe®
Probe Cards LiProbe®

LiProbe® lamella contacts (lamella beams) offer outstanding advantages in radio frequency testing (MHz to GHz) and meet the highest requirements for force and precision. Their short design and flexible number of lamellae ensure excellent signal quality and reliability.

FEINMETALL Probe Cards: FeinProbe®
Probe Cards FeinProbe®

FeinProbe® has been specially developed for WLCSP, SiP, and flip chip testing. Testing these types of wafers requires FeinProbe® spring contact probes that can withstand high currents while ensuring high signal integrity.

Probe Card Service

Solutions that go far beyond the product. Learn more about our probe card service here.

FEINMETALL Probe Cards Service
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