Our portfolio
Flexible solutions with added value: We offer leading technological solutions including comprehensive support.
ViProbe® – the proven vertical test card solution for the semiconductor industry. Adaptable, versatile, and particularly easy to maintain thanks to simple repairs – for minimal downtime and reduced costs.
The ViProbe® II expands the proven ViProbe® with options for extending service life and improving safety for the DUT. The vertical test card solution offers high reliability, excellent signal integrity, and optimal protection for demanding wafer tests.
LiProbe® lamella contacts (lamella beams) offer outstanding advantages in radio frequency testing (MHz to GHz) and meet the highest requirements for force and precision. Their short design and flexible number of lamellae ensure excellent signal quality and reliability.
FeinProbe® has been specially developed for WLCSP, SiP, and flip chip testing. Testing these types of wafers requires FeinProbe® spring contact probes that can withstand high currents while ensuring high signal integrity.
Probe Card Service
Solutions that go far beyond the product. Learn more about our probe card service here.