Glossary

Aoi (Automated Optical Inspection) is a camera-based testing method for visual quality control of printed circuit boards and electronic assemblies in the manufacturing process.

Automotive electronics testing refers to the testing of electronic assemblies and systems for use in vehicles.

The Automotive Industry demands the highest quality, safety, and reliable testing technology.

AXI enables non-destructive testing of concealed solder joints, e.g., in BGA components and complex assemblies.

Outer package of a Contact Probe that guides the Plunger and Spring and ensures mechanical stability and defined electrical properties.

The shell diameter defines the outer diameter of the contact pin shell and is critical for fit, guidance, and interchangeability within the Receptacle.

Coatings protect Contact Probes and stabilize electrical properties.

Basic Contact Probes form the basis of modular contact solutions in testing technology.

Basic Threaded Probes enable secure and interchangeable contact in the Test Fixture.

Battery Cell Contacting establishes secure electrical contacts during cell testing processes.

Battery Cell Manufacturers require precise testing technology for quality and safety.

Battery Testing for electric mobility and energy storage: testing of characteristic values, thermal behavior, safety, and Lifetime.

Bga Contacting refers to the electrical connection of components with a Ball Grid Array (BGA), in which the connections are located as solder balls on the underside of the component. Special Contact Probes are used for testing, which make precise contact with these solder points. The challenge lies in the high packing density and the limited accessibility of the contacts.

A Blocking Tester checks the mobility of Spring Contact Probes and detects blocked or stiff components at an early stage.

Block plating: Surface finishing of a block-shaped component to improve corrosion protection, conductivity, and wear resistance.

Board testing involves electrical testing of assembled or unassembled printed circuit boards to detect defects such as open circuits, short circuits, or faulty components. Test Fixtures with Contact Probes are used to make contact with defined test points on the printed circuit board. Typical methods include In-Circuit Test (ICT), Flying Probe Test, and Functional Test.

Digital test procedure in accordance with the IEEE 1149 standard for testing printed circuit board connections without direct access to test points.

Cell Formation is a key step in the manufacturing process for battery cells. During the manufacturing process, charging and discharging a battery cell forms its basic electrochemical structure.

A Coaxial Probe is used for the contact transmission of high-frequency signals with a defined Impedance.

The collar diameter defines the size of a step on Contact Probes or sockets and is critical for positioning, insertion depth, and support within the Test Fixture.

The collar height defines the axial position of a Contact Probe or Receptacle in the Test Fixture and is crucial for precise and stable contact.

A Combi Receptacle combines guide and insulation functions in a single component for compact and integrated contact solutions.

A connecting element is a mechanical and electrical connecting element between the test system, Test Fixture, and test object. It enables the reliable transmission of signals or currents and ensures mechanical stability.

Flux-proof connection types prevent the ingress of solder and ensure the function and lifetime of contact elements.

Testing connectors for continuity, contact quality, and secure fit.

Consumer Electronics encompasses electronic devices for personal use and places high demands on functionality, safety, and reliability.

The force with which a Contact Probe is pressed against the Test Point, which influences the quality of the electrical contact.

Contacting refers to the deliberate establishment of an electrical connection between Spring Contact Probes and test points on printed circuit boards within a test system.

Contact Probes, also known as Spring Contact Probes, are key components in electronic testing used to establish temporary electrical connections. They enable reliable contact between test systems and test points on printed circuit boards and are used in applications such as ICT, FCT, and Flying Probe Tests. Different designs, spring forces, and contact geometries allow for application-specific configuration within Test Fixtures and test systems.

Electrical resistance at the contact point between the Contact Probe and the Test Point, which affects the quality of the electrical connection.

Typical contact resistance: A reference value for the electrical resistance of contact connections used to evaluate contact quality in testing technology.

Continuity Testing checks whether there is an electrical connection between two points. It is used to detect breaks in circuit traces, cables, or assemblies. Typical applications include testing printed circuit boards, cable harnesses, and connectors during production.

Maximum current that a contact or connecting element can carry continuously without unacceptable heating.

A crimp connection is a form-fit and force-fit electrical connection that is created by plastically deforming a metallic crimp area around a conductor. It is a technical term from industrial test engineering and is used in automated test processes.

The device under test (DUT) is the component, assembly, or system that is examined as part of a testing process.

A Double Plunger Probe is a Spring Contact Probe with two stroke ranges for combining contact and switch functions in a test setup.

E-mobility encompasses electrically powered vehicles and systems, as well as the infrastructure supporting sustainable transportation.

E-Mobility & Pogo Solutions is a business unit of FEINMETALL and bundles solutions for highly reliable contacting applications in the mobility industry.

The electronics industry encompasses the development, manufacture, and testing of electronic components and systems with high standards of precision and miniaturization.

Electronic Testing is a Business Unit of FEINMETALL and bundles solutions for the precise testing of electronic components, assemblies, and systems.

The End-Of-Line Test is the final inspection step to ensure a product’s functionality, quality, and safety before shipment.

The Enig Finish is a printed circuit board coating consisting of a nickel layer and a gold overlay, designed to provide high solderability, flat surfaces, and reliable electrical contact.

Spring Contact Probes for connecting components in functional test systems (FCT) to verify electrical function under operating conditions.

FEINMETALL test card solution with Spring Contact Probes for precise contacting of bumps on WLCSP, SiP, and flip chip wafers.

Final Testing is the concluding Functional Test of an electronic product at the end of production. It verifies that the product functions correctly under real-world operating conditions. It serves as the final quality control check before shipment and ensures that all requirements are met.

Fine Pitch & Interface Solutions is a business unit of FEINMETALL that specializes in contact solutions for applications with very small pitch dimensions and high signal quality requirements. The focus is on the development and manufacture of Contact Probes and Interface Solutions for semiconductor and electronics testing.

A Fine Pitch Contact Probe is a contact probe used for contacting very small pad spacings (pitch) on printed circuit boards or semiconductors. It enables precise electrical testing of highly integrated components where standard contact probes can no longer be used due to the small pitch. Typical applications include wafer testing, IC testing, and high-density PCB testing.

Movable Contact Probe for Flying Probes for flexible testing of individual test points without a fixed needle array.

The Flying Probe Test is an electrical testing method for printed circuit boards in which movable test probes automatically make contact with various test points. Unlike Test Fixtures, no fixed pin header is required, making the test particularly flexible and cost-effective for small production runs and prototypes.

FM Choice is a selection of proven FEINMETALL Contact Probes that are readily available and offer attractive value for money.

Frequency describes the number of signal cycles per second of an electrical signal and is measured in hertz (Hz).

Fct (Functional Test): Test procedure for checking the function of electronic assemblies under real operating conditions.

Handler: Automated system in the semiconductor back end that feeds, positions, checks, and sorts components according to test results.

High-Speed Testing is a test of high-speed signals and interfaces in which signal shape, timing, and transmission quality are evaluated.

High Current Blocks are connecting elements for test setups that enable safe contacting and testing of high electrical currents.

A High Current Probe is a contact probe specifically designed for transmitting high electrical currents. It features larger contact surfaces and optimized materials to minimize heat generation and transition resistance.

High Current Testing refers to test procedures in which high continuous or Pulse currents are transmitted safely and constantly.

A Hook Wrench is a tool used for the secure installation and adjustment of components with a slot or ring profile, enabling damage-free force transmission.

ICT Contact Probes are Spring Contact Probes used to make contact with test points on printed circuit boards during the In-Circuit Test (ICT).

Impedance describes the complex AC resistance of an electrical connection and consists of ohmic resistance, inductance, and capacitance. It significantly influences signal transmission in test and contact systems, particularly in Radio Frequency and high-speed applications, and is crucial for low-loss and interference-free signal transmission.

The In-Circuit Test is an electrical testing method used to inspect individual components and connections on a printed circuit board. Parameters such as resistance, capacitance, and short circuits are measured directly at the test points. It enables rapid fault localization even during production.

An Insertion and Alignment Tool is used to precisely position Contact Probes and test specimens in the test setup and ensures reproducible and reliable contact.

An Insertion Tool enables the precise assembly of Contact Probes and ensures uniform force application as well as reproducible positioning in test adapter construction.

The inner/outer spacing determines the packing density of contacts and is crucial for compact Test Fixtures.

An insulating receptacle is used to electrically insulate Contact Probes and ensures safe spacing between conductive components.

An interface describes the connection between two systems or components through which signals or data are transmitted. In electronic testing, it enables the connection between the test system, the Test Fixture, and the device under test. It is crucial for stable and reliable signal transmission.

Technical concepts for stable and durable connection of test systems, Test Fixtures, and test specimens.

An interposer is an interface block used to connect printed circuit boards and enables compact, high-density contact using Spring Contact Probes.

The Kelvin Measurement is a four-wire measurement method for the precise determination of small resistances and minimizes the effects of contact and lead resistances.

A Kelvin Probe is a Contact Probe used for four-wire measurements, in which current and voltage are carried separately. This minimizes measurement errors and enables highly accurate resistance measurements.

The lighting industry encompasses the development and manufacture of lighting systems and places high demands on functionality, Lifetime, and reliability.

FEINMETALL test card solution with MEMS lamella contacts for precise Radio Frequency and High Current Testing.

Maximum travel (max. travel) describes the maximum possible stroke of a Spring Contact Probe without causing mechanical overload or damage.

Medical Technology encompasses the development, manufacture, and testing of medical devices, which must meet the highest standards of precision, reliability, and process safety.

Micro PCBs are printed circuit boards with very fine conductor tracks and small distances between structures. They are used in highly integrated electronic applications and require particularly precise testing and contact solutions.

Testing of highly integrated printed circuit boards with fine structures using precise contact solutions.

A Non-Test Application describes the use of Contact Probes for permanent electrical connections outside of test engineering.

The Osp Coating is an organic protective layer on printed circuit boards that ensures solderability and imposes specific requirements on contacting in test engineering.

The outer diameter defines the outer dimension of a component and is critical for its mounting, guidance, and securing in the Test Fixture.

In the Semiconductor Industry, packages protect chips and enable electrical contact via defined connection surfaces such as BGA or QFN.

Circuit Board Testing using ICT and FCT to verify functionality, wiring, and signal quality. Precision test probes and Progressive Series for maximum process reliability.

The pin diameter describes the diameter of a Contact Probe in mm and affects the fit, contact area, and mechanical stability.

The pin length describes the axial length of a Contact Probe in mm and affects installation, spring travel, and mechanical integration.

The pitch describes the distance between two adjacent contact points on a printed circuit board or an electronic component. It is typically specified in millimeters or micrometers and is a critical parameter for selecting suitable Contact Probes and Test Fixtures. Small pitches require particularly precise contact solutions and place high demands on test technology.

The diameter of a disc-shaped contact surface used to influence spring force and contact area.

Coatings improve conductivity, wear resistance, and contact reliability.

Movable element of a Spring Contact Probe that is pressed against the Test Point by Spring force and establishes electrical contact.

Piston coating of Contact Probes reduces contact resistance and wear and increases lifetime and reliability.

A pogo block is a mechanical contact block equipped with a large number of Spring Contact Probes (Pogo Pins).

Plug connection with integrated Spring Contact Probes for reliable, pluggable, and highly repeatable electrical contacts.

The Pogo Tower is a contact assembly with Contact Probes for electrical connection between the tester and the Interface. It ensures precise signal transmission.

The positioning accuracy of a Contact Probe relative to the Test Point for reliable contact.

Position Testing: Test procedure for checking the correct component position using defined contacts.

Preload refers to a mechanical force intentionally applied to a component or system prior to the actual load.

Presence Testing is a test procedure used to determine whether a component, contact, or plug-in element is present and correctly positioned.

The press ring diameter determines the press fit of Contact Probes and affects retention, assembly force, and mechanical stability.

A Probe Card is a contact unit in test systems that transmits electrical signals between the test system and the device under test.

FEINMETALL Product Finder: a digital tool for the precise selection of Contact Probes based on technical parameters and specific testing requirements.

The Progressive Series includes Contact Probes designed for reliable contact with contaminated test points, featuring an optimized Tip style, higher first-pass yield, and longer service life.

The projection height describes the distance by which a Contact Probe or component protrudes from a receptacle, Receptacle, or Test Fixture. It is an important parameter for proper contact in the test setup, as it determines the available spring travel and ensures a secure electrical connection without mechanical overload.

Front part of a Contact Probe that establishes electrical contact with the Test Point and has a significant influence on contact quality.

Contact Probe with locking mechanism for defined positioning and secure fixation in the Test Fixture.

Push Back Testing checks the function and reliability of locking mechanisms in Push Back Probes or connectors.

Radio frequencies are electrical signals with high frequencies that place special demands on contacting, Impedance, and signal integrity in test engineering.

Contact Probe for low-loss and impedance-controlled transmission of high-frequency signals.

Radio Frequency Testing evaluates the behavior of electrical signals in the MHz to GHz range. Parameters such as Impedance, signal loss, and reflections are analyzed to ensure signal integrity.

A receptacle is a mechanical component used to guide, hold, or insulate Contact Probes in Test Fixtures or contacting systems. It ensures precise positioning of the Contact Probes and contributes to the mechanical stability and reliable functioning of the entire contacting system.

The recommended spring travel describes the operating range of a Spring Contact Probe within which reliable and reproducible contact is guaranteed.

A Rigid Probe is a Contact Probe without a spring mechanism. It is used in Test Fixtures or contact systems when no tolerance compensation is required and a fixed, defined electrical connection needs to be established. Rigid Probes are often used for signal transmission, current conduction, or as mechanical contact elements in test applications.

A Screw in Tool is used for the precise and controlled installation of Threaded Probes and screw-in contact elements with a defined torque.

The Semiconductor Industry encompasses the development, manufacturing, and testing of semiconductors and places the highest demands on precision and testing technology.

The business unit develops solutions for wafer, package, and module testing that require the highest precision, Signal integrity, and Repeatability.

Testing sensors for function, accuracy, and reliability—performed with precise Contact Probes.

A test fixture in which electrical components such as microchips (semiconductor back-end) and Sensors are tested. Fine Pitch Probes are installed inside the socket, which make contact with the contact surfaces of these components.

A Socket Wrench is a tool used to securely tighten and loosen screw connections and is used in test engineering for mounting Test Fixtures.

The Solar Industry encompasses the development and manufacture of components for generating energy from sunlight and places high demands on performance, reliability, and Lifetime.

Solar Wafer Testing with specialized busbar contacting for precise measurements, low resistance, and long Lifetime.

A spacer is a mechanical component used to maintain a defined distance between components in Test Fixtures, test systems, and contact solutions. It serves to precisely define installation heights, Pitch, distances, and positions of Contact Probes, Spring Contact Probes, or assemblies. This ensures reproducible contacting and a stable electrical connection in the test setup.

The spade diameter describes the effective diameter of the spade-shaped tip style of a Contact Probe. It is an important parameter for the fit to the Test Point and influences contact quality, contact area, and the electrical and mechanical stability of the connection. A proper design ensures reliable and reproducible contact.

Spade length refers to the length of a spade-shaped contact area at the tip of a Contact Probe. It influences the installation configuration, the effective contact area, and the contact behavior upon contact with the Test Point. An appropriate spade length contributes to stable and reproducible electrical contact.

The spade width describes the width of a blade-shaped tip style at the contact tip and determines the size of the contact surface to the Test Point.

A Spinning Tool enables the controlled insertion of Contact Probes and Receptacles and ensures precise and repeatable assembly in test adapter manufacturing.

Mechanical functional element in Spring Contact Probes that generates the spring force and compensates for tolerances in the Test Fixture.

Spring-loaded Contact Probes are components designed to provide reliable electrical contact with Test Points, featuring constant Contact force and high reproducibility.

A Spring Contact Probe consists of a plunger, spring, and barrel and enables reproducible contacting for ICT, FCT, and high-current applications. Variants include switching, Kelvin, and RF designs.

The mechanical force of a spring that determines the contact pressure and contact quality.

A spring force measuring device is used to measure the spring force of Contact Probes and to ensure consistent quality and function.

Spring plating on the spring in the Spring Contact Probe ensures corrosion protection, low friction, and consistent electrical performance.

Contact Probe with plate-shaped geometry for defined and large-area electrical contacting.

Stroke / Working Travel refers to the movement of a Contact Probe between its starting and ending positions.

The switch function describes the electrical behavior of a switch or Switch Probe during operation.

Contact Probe with integrated Switch function for simultaneous contacting and status or presence detection.

The switch travel is the distance traveled by a Switch Probe until a switching operation is triggered.

The switch type describes the operating principle and design of a switch or Switch Probe.

Telecommunications refers to the transmission of information via electrical or optical signals and places high demands on signal quality and reliability.

Temperature in degrees Celsius (°C) is a key environmental and operating parameter that influences the electrical and mechanical behavior of components, Contact Probes, and contact systems. Among other things, it affects contact resistance, material expansion, Spring force, and signal transmission. In testing technology, temperature tests are specifically used to ensure functionality and reliability under real-world operating conditions.

A test fixture is a device used to establish electrical contact with printed circuit boards or electronic assemblies during testing. It contains Contact Probes that make contact with defined Test Points, thereby enabling measurements. Test fixtures are used in automated test systems, particularly for In-Circuit Test and Functional Test.

A thread is a spiral-shaped structure used to connect components in a detachable manner and, in contact technology, serves to securely fasten Threaded Probes in Receptacles.

The thread pitch defines the axial travel per revolution and affects the precise alignment and insertion depth of Threaded Probes in Receptacles.

Geometric shape of the contact tip of a Contact Probe, which influences contact behavior, penetration depth, and wear.

The tip style diameter defines the size of a Contact Probe’s contact tip and influences the contact area, force distribution, and contact quality.

The tip style plating on a Contact Probe determines the contact behavior at the contact point.

The total length of a Contact Probe or component, relevant for installation, insertion depth, and mechanical integration into the Test Fixture.

Contact Probe with integrated anti-rotation device for defined alignment and stable contacting in the Test Fixture.

A specific variant of a product with defined technical characteristics within a product family.

Vehicle manufacturing encompasses the development and production of vehicles and their components, with high standards for quality, safety, and reliability.

ViProbe®: Vertical test card solution from FEINMETALL for precise wafer testing in the Semiconductor Industry.

ViProbe® II: Vertical FEINMETALL test card solution for wafer testing with high reliability, improved DUT safety, and extended lifetime.

Wafer testing is an early testing step in semiconductor manufacturing in which individual chips are electrically tested directly on the wafer. Special test contacts are used to verify functionality before the chips are separated. This allows defective components to be sorted out at an early stage.

The Wire Harness Test checks wiring harnesses for continuity, wiring, insulation, and connections, ensuring reliable electrical connections.

Wire Harness Testing is a Business Unit of FEINMETALL and bundles solutions for the precise testing of cable harnesses.

A wobbling plunger allows for lateral deflection and improves contact on sloped or uneven surfaces.