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Basic Contact Probes (100 mil) F10014B130G150

Item number 1017536

Technical data sheet

Quantity

Technical data

General
Structure Basic Contact Probe
Type/family F100
Pitch (mm/mil) 2,54 / 100
Temperature -45°C...+80°C
Dimensions
Total length (mm) 33.3
Protrusion height (mm) 8.5
Tip style diameter (mm) 1.3
Barrel diameter (mm) 1.37
Materials and surfaces
Tip style 14
Plunger material Beryllium copper
Plunger plating Gold
Barrel material Bronze
Barrel plating Gold
Spring material Spring steel
Spring plating Silver
Mechanical specifications
Preload (cN) 80
Spring force (cN) 150
Nominal travel (mm) 4.3
Maximum travel (mm) 6.4
Pointing accuracy +/- (mm) 0.08
Electrical specifications
Continuous current (A) 5
Typical contact resistance (mOhm) 20

Graphics

F10014B130G150 Overview of similar Receptacles F10014B130G150 Family designation F10014B130G150 Tip style 1

Beschreibung des Produkts

The Basic Contact Probe F10014B130G150 (item number 1017536) is a spring-loaded probe for temporary electrical contact with test points. With tip style 14 (4-point crown stepped (self-cleaning)), F10014B130G150 combines ICT/FCT use with a geometry intended for pad surfaces and soldered pins where the crown geometry can penetrate residues or oxide layers. F10014B130G150 combines a pitch of 2.54 mm / 100 mil with tip style 14 (4-point crown stepped (self-cleaning)) and a tip diameter of 1.3 mm. For F10014B130G150, spring force is 150 cN at a nominal travel of 4.3 mm. The electrical rating of F10014B130G150 combines 5 A continuous current with 20 mΩ typical contact resistance. The plunger in F10014B130G150 is made of beryllium copper and is gold-plated.